AVALUR, Dia; KISHORE, Nitika; TOKALA, Anika. Modeling internal defects in conductive materials using electric potential measurements. Journal of Science & Engineering, Englishtown, NJ, v. 2, n. 4, p. 61–67, 2026. DOI: 10.64804/9wkhqz81. Disponível em: https://j.snerds.org/index.php/jse/article/view/142. Acesso em: 14 apr. 2026.